HTS
2023 HTSA Revision 9
Search Results:35
9031
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:
9031.10.00.00
Machines for balancing mechanical parts
9031.20.00.00
Test benches
9031.41.00
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
9031.41.00.20
For inspecting photomasks or reticles used in manufacturing semiconductor devices
9031.41.00.40
For wafers
9031.41.00.60
Other
9031.49
Other:
9031.49.10.00
Profile projectors
9031.49.40.00
Coordinate-measuring machines
9031.49.70.00
For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
9031.49.90.00
Other
9031.80
Other instruments, appliances and machines:
9031.80.40.00
Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
9031.80.80
Other
9031.80.80.60
For testing electrical characteristics
9031.80.80.70
Other
9031.80.80.85
Other
9031.90
Parts and accessories:
9031.90.21.00
Of profile projectors
9031.90.45.00
Bases and frames for the coordinate-measuring machines of subheading 9031.49.40
9031.90.54.00
Of optical instruments and appliances of subheading 9031.41 or 9031.49.70
9031.90.59.00
Other
9031.90.70.00
Of articles of subheading 9031.80.40
9031.90.91
Other
9031.90.91.30
Of machines for balancing mechanical parts
9031.90.91.60
Of test benches
9031.90.91.95
Other
9817.84.01
Wheelbuilding, wheel-trueing, rimpunching, tire fitting and similar machines (provided for in subheading 8462.22, 8462.23, 8462.24, 8462.25, 8462.26, 8462.29, 8462.42, 8462.49, 8462.51, 8462.59, 8479.83, 8479.89.95, 8485.10.01 or 9031.80), all the foregoing suitable for use in the manufacture of wheels for bicycles
9902.16.96
Electrical cables and cable bundles for a voltage not exceeding 1,000 V, fitted with connectors (provided for in subheading 8544.42.90), the foregoing of a kind used with machines and apparatus for the manufacture or inspection of semiconductor devices of subheading 8486.20.00 or with optical instruments and appliances for inspecting semiconductor wafers of 9031.41.00
9031.90.45.00
Bases and frames for the coordinate-measuring machines of subheading 9031.49.40
9031.90.54.00
Of optical instruments and appliances of subheading 9031.41 or 9031.49.70
9031.90.70.00
Of articles of subheading 9031.80.40
9817.84.01
Wheelbuilding, wheel-trueing, rimpunching, tire fitting and similar machines (provided for in subheading 8462.22, 8462.23, 8462.24, 8462.25, 8462.26, 8462.29, 8462.42, 8462.49, 8462.51, 8462.59, 8479.83, 8479.89.95, 8485.10.01 or 9031.80), all the foregoing suitable for use in the manufacture of wheels for bicycles
9902.16.96
Electrical cables and cable bundles for a voltage not exceeding 1,000 V, fitted with connectors (provided for in subheading 8544.42.90), the foregoing of a kind used with machines and apparatus for the manufacture or inspection of semiconductor devices of subheading 8486.20.00 or with optical instruments and appliances for inspecting semiconductor wafers of 9031.41.00
Heading/
Subheading		 Stat
Suffix		 Article Description Unit of
Quantity		 Rates of Duty
1 2
General Special
Heading/
Subheading		 Stat
Suffix		 Article Description Unit of
Quantity		 Rates of Duty
1 2
General Special
9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:
9031.10.00 00 Machines for balancing mechanical parts
No.
Free40%
9031.20.00 00 Test benches
No.
1.7%Free (A*,AU,BH,CL,CO,D,E,IL,JO,KR,MA,OM,P,PA,PE,S,SG)45%
Other optical instruments and appliances:
9031.41.00For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)Free50%
20 For inspecting photomasks or reticles used in manufacturing semiconductor devices
No.
For inspecting semiconductor wafers or devices:
9031.41.00 40 For wafers
No.
60 Other
No.
9031.49Other:
9031.49.10 00 Profile projectors
No.
Free45%
9031.49.40 00 Coordinate-measuring machines
No.
Free50%
9031.49.70 00 For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
No.
Free50%
9031.49.90 00 Other
No.
Free50%
9031.80Other instruments, appliances and machines:
9031.80.40 00 Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
No.
Free40%
9031.80.80OtherFree40%
Equipment for testing the characteristics of internal combustion engines:
9031.80.80 60 For testing electrical characteristics
kg
70 Other
kg
85 Other
kg
9031.90Parts and accessories:
9031.90.21 00 Of profile projectors
kg
Free45%
Of other optical instruments and appliances, other than test benches:
9031.90.45 00 Bases and frames for the coordinate-measuring machines of subheading 9031.49.40
kg
Free50%
9031.90.54 00 Of optical instruments and appliances of subheading 9031.41 or 9031.49.70
kg
Free50%
9031.90.59 00 Other
kg
Free50%
Other:
9031.90.70 00 Of articles of subheading 9031.80.40
kg
Free40%
9031.90.91OtherFree40%
30 Of machines for balancing mechanical parts
kg
60 Of test benches
kg
95 Other
kg