HTS
2023 HTSA Revision 9
Search Results:10
9031.80
Other instruments, appliances and machines:
9031.80.40.00
Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
9031.80.80
Other
9031.80.80.60
For testing electrical characteristics
9031.80.80.70
Other
9031.80.80.85
Other
9031.90.70.00
Of articles of subheading 9031.80.40
9817.84.01
Wheelbuilding, wheel-trueing, rimpunching, tire fitting and similar machines (provided for in subheading 8462.22, 8462.23, 8462.24, 8462.25, 8462.26, 8462.29, 8462.42, 8462.49, 8462.51, 8462.59, 8479.83, 8479.89.95, 8485.10.01 or 9031.80), all the foregoing suitable for use in the manufacture of wheels for bicycles
9031.90.70.00
Of articles of subheading 9031.80.40
9817.84.01
Wheelbuilding, wheel-trueing, rimpunching, tire fitting and similar machines (provided for in subheading 8462.22, 8462.23, 8462.24, 8462.25, 8462.26, 8462.29, 8462.42, 8462.49, 8462.51, 8462.59, 8479.83, 8479.89.95, 8485.10.01 or 9031.80), all the foregoing suitable for use in the manufacture of wheels for bicycles
| Heading/ Subheading |
Stat Suffix |
Article Description | Unit of Quantity |
Rates of Duty | ||
| 1 | 2 | |||||
| General | Special | |||||
| Heading/ Subheading |
Stat Suffix |
Article Description | Unit of Quantity |
Rates of Duty | ||
| 1 | 2 | |||||
| General | Special | |||||
| 9031 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | |||||
| 9031.10.00 | 00 | Machines for balancing mechanical parts | No. | Free | 40% | |
| 9031.20.00 | 00 | Test benches | No. | 1.7% | Free (A*,AU,BH,CL,CO,D,E,IL,JO,KR,MA,OM,P,PA,PE,S,SG) | 45% |
| Other optical instruments and appliances: | ||||||
| 9031.41.00 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free | 50% | |||
| 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | ||||
| For inspecting semiconductor wafers or devices: | ||||||
| 9031.41.00 | 40 | For wafers | No. | |||
| 60 | Other | No. | ||||
| 9031.49 | Other: | |||||
| 9031.49.10 | 00 | Profile projectors | No. | Free | 45% | |
| 9031.49.40 | 00 | Coordinate-measuring machines | No. | Free | 50% | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | 50% | |
| 9031.49.90 | 00 | Other | No. | Free | 50% | |
| 9031.80 | Other instruments, appliances and machines: | |||||
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | 40% | |
| 9031.80.80 | Other | Free | 40% | |||
| Equipment for testing the characteristics of internal combustion engines: | ||||||
| 9031.80.80 | 60 | For testing electrical characteristics | kg | |||
| 70 | Other | kg | ||||
| 85 | Other | kg | ||||
| 9031.90 | Parts and accessories: | |||||
| 9031.90.21 | 00 | Of profile projectors | kg | Free | 45% | |
| Of other optical instruments and appliances, other than test benches: | ||||||
| 9031.90.45 | 00 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | kg | Free | 50% | |
| 9031.90.54 | 00 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | kg | Free | 50% | |
| 9031.90.59 | 00 | Other | kg | Free | 50% | |
| Other: | ||||||
| 9031.90.70 | 00 | Of articles of subheading 9031.80.40 | kg | Free | 40% | |
| 9031.90.91 | Other | Free | 40% | |||
| 30 | Of machines for balancing mechanical parts | kg | ||||
| 60 | Of test benches | kg | ||||
| 95 | Other | kg | ||||